2FGR
High resolution Xray structure of Omp32
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ESRF BEAMLINE ID14-4 |
| Synchrotron site | ESRF |
| Beamline | ID14-4 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2002-12-01 |
| Detector | ADSC QUANTUM 4 |
| Wavelength(s) | 1.0053 |
| Spacegroup name | P 63 |
| Unit cell lengths | 106.410, 106.410, 93.790 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 20.000 - 1.500 |
| R-factor | 0.151 |
| Rwork | 0.150 |
| R-free | 0.18000 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.021 |
| RMSD bond angle | 1.696 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.1.24) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 20.000 | 1.590 |
| High resolution limit [Å] | 1.500 | 1.500 |
| Number of reflections | 92517 | |
| Completeness [%] | 92.1 | 78.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 8.5 | 293 | PEG4000, pH 8.5, VAPOR DIFFUSION, HANGING DROP, temperature 20K, temperature 293K |
