2AXV
Structure of PrgX Y153C mutant
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS BEAMLINE X25 |
| Synchrotron site | NSLS |
| Beamline | X25 |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2004-03-03 |
| Wavelength(s) | 0.97940 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 82.076, 82.076, 263.480 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 20.000 - 3.000 |
| R-factor | 0.24156 |
| Rwork | 0.239 |
| R-free | 0.27962 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.019 |
| RMSD bond angle | 1.708 |
| Refinement software | REFMAC (5.2.0005) |
Data quality characteristics
| Overall | |
| Low resolution limit [Å] | 45.000 |
| High resolution limit [Å] | 3.000 |
| Number of reflections | 47514 |
| Completeness [%] | 95.3 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 5 | 298 | PEG 4000, citrate-phophate, pH 5.0, VAPOR DIFFUSION, temperature 298K |
