1YYF
Correction of X-ray Intensities from an HslV-HslU co-crystal containing lattice translocation defects
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | PHOTON FACTORY BEAMLINE BL-18B |
Synchrotron site | Photon Factory |
Beamline | BL-18B |
Detector technology | IMAGE PLATE |
Collection date | 2001-03-07 |
Spacegroup name | H 3 2 |
Unit cell lengths | 181.196, 181.196, 529.924 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 34.920 - 4.160 |
R-factor | 0.2802 |
Rwork | 0.277 |
R-free | 0.34572 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.033 |
RMSD bond angle | 2.904 |
Data reduction software | HKL-2000 |
Data scaling software | SCALEPACK |
Phasing software | CNS |
Refinement software | REFMAC (5.1.24) |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | EVAPORATION | EVAPORATION |