1T2O
Crystal structure of Se-SrtA, C184-Ala
Experimental procedure
| Experimental method | MAD |
| Source type | SYNCHROTRON |
| Source details | NSLS BEAMLINE X4A |
| Synchrotron site | NSLS |
| Beamline | X4A |
| Temperature [K] | 100 |
| Detector technology | CCD |
| Collection date | 2002-03-20 |
| Detector | ADSC QUANTUM 4 |
| Wavelength(s) | 0.9791, 0.9439, 1.212 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 46.553, 82.407, 56.112 |
| Unit cell angles | 90.00, 104.17, 90.00 |
Refinement procedure
| Resolution | 17.710 - 2.300 |
| R-factor | 0.221 |
| Rwork | 0.221 |
| R-free | 0.27500 |
| Structure solution method | SAD |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.400 |
| Data reduction software | DENZO |
| Data scaling software | SCALEPACK |
| Phasing software | CNS |
| Refinement software | CNS (1.0) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 2.400 | 2.400 |
| High resolution limit [Å] | 2.300 | 2.300 |
| Number of reflections | 35415 | |
| Completeness [%] | 99.0 | 99 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | 6.35 | 300 | Ammonium Sulfate, MES, Sodium Chloride, pH 6.35, VAPOR DIFFUSION, HANGING DROP, temperature 300K |
