1P92
Crystal Structure of (H79A)DtxR
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | ROTATING ANODE |
Source details | RIGAKU |
Temperature [K] | 277 |
Detector technology | IMAGE PLATE |
Collection date | 2001-11-05 |
Detector | RIGAKU RAXIS IV |
Wavelength(s) | 1.5418 |
Spacegroup name | P 31 2 1 |
Unit cell lengths | 63.390, 63.390, 109.872 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 27.450 - 2.100 |
R-factor | 0.243 |
Rwork | 0.243 |
R-free | 0.28000 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | PDB ENTRIES 1BYM 2tdx |
RMSD bond length | 0.007 |
RMSD bond angle | 2.000 |
Data reduction software | DENZO |
Data scaling software | SCALEPACK |
Phasing software | EPMR |
Refinement software | CNS (1.0) |
Data quality characteristics
Overall | |
Low resolution limit [Å] | 30.000 |
High resolution limit [Å] | 2.100 |
Rmerge | 0.078 |
Number of reflections | 15278 |
<I/σ(I)> | 12.9 |
Completeness [%] | 98.8 |
Redundancy | 2.24 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 8 | 298 | PEG 400, ammonium sulfate, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 298K |