1F1G

Crystal structure of yeast cuznsod exposed to nitric oxide

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS BEAMLINE X12B
Synchrotron site	NSLS
Beamline	X12B
Temperature [K]	93
Detector technology	IMAGE PLATE
Detector	MARRESEARCH
Spacegroup name	P 1
Unit cell lengths	72.500, 72.480, 72.470
Unit cell angles	109.20, 109.55, 109.21

Refinement procedure

Resolution	40.000 - 1.350
Rwork	0.171
RMSD bond length	0.011
RMSD bond angle	2.100
Data scaling software	SCALEPACK
Phasing software	AMoRE
Refinement software	SHELXL-97

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	40.000	1.400
High resolution limit [Å]	1.350	1.350
Rmerge	0.088	0.223
Number of reflections	233021
<I/σ(I)>	13.3
Completeness [%]	94.4	92.5
Redundancy	6.6

Crystallization Conditions

crystal ID	method	pH	temperature	details
1	VAPOR DIFFUSION, HANGING DROP	7.7	298	ammonium sulfate, Tris-Hcl, NaCl, pH 7.7, VAPOR DIFFUSION, HANGING DROP, temperature 298K