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1CW0

CRYSTAL STRUCTURE ANALYSIS OF VERY SHORT PATCH REPAIR (VSR) ENDONUCLEASE IN COMPLEX WITH A DUPLEX DNA

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSPRING-8 BEAMLINE BL24XU
Synchrotron siteSPring-8
BeamlineBL24XU
Temperature [K]100
Detector technologyIMAGE PLATE
Collection date1999-06-10
DetectorRIGAKU RAXIS
Spacegroup nameP 65
Unit cell lengths63.000, 63.000, 152.500
Unit cell angles90.00, 90.00, 120.00
Refinement procedure
Resolution22.000 - 2.300
R-factor0.204
Rwork0.204
R-free0.23000
Starting model (for MR)TRUNCATED VSR MODEL 1vsr
RMSD bond length0.011
RMSD bond angle24.300

*

Data reduction softwareDENZO
Data scaling softwareSCALEPACK
Phasing softwareAMoRE
Refinement softwareCNS
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]22.000

*

2.380
High resolution limit [Å]2.3002.300
Rmerge0.048

*

0.261

*

Number of reflections15168

*

<I/σ(I)>14.4
Completeness [%]99.4

*

100
Redundancy4.64.6
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1Batch method

*

5.620

*

pH 5.60, VAPOR DIFFUSION, HANGING DROP
Crystallization Reagents in Literatures
IDcrystal IDsolutionreagent nameconcentration (unit)details
111DNA1.5 (mM)
211protein0.5 (mM)
31120 (mM)
411PEG80002.5 (%)
511MES25 (mM)
611100 (mM)
71115 (mM)
811Tris-HCl6.5 (mM)
91131.0 (mM)

226707

PDB entries from 2024-10-30

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