1YYF
Correction of X-ray Intensities from an HslV-HslU co-crystal containing lattice translocation defects
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PHOTON FACTORY BEAMLINE BL-18B |
| Synchrotron site | Photon Factory |
| Beamline | BL-18B |
| Detector technology | IMAGE PLATE |
| Collection date | 2001-03-07 |
| Spacegroup name | H 3 2 |
| Unit cell lengths | 181.196, 181.196, 529.924 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 34.920 - 4.160 |
| R-factor | 0.2802 |
| Rwork | 0.277 |
| R-free | 0.34572 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.033 |
| RMSD bond angle | 2.904 |
| Data reduction software | HKL-2000 |
| Data scaling software | SCALEPACK |
| Phasing software | CNS |
| Refinement software | REFMAC (5.1.24) |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | EVAPORATION | EVAPORATION |
