1RGX
Crystal Structure of resisitin
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | APS BEAMLINE 31-ID |
Synchrotron site | APS |
Beamline | 31-ID |
Temperature [K] | 110 |
Detector technology | CCD |
Collection date | 2000-12-02 |
Detector | MACSCIENCE |
Wavelength(s) | 1.0542517 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 49.021, 52.475, 96.609 |
Unit cell angles | 90.00, 96.53, 90.00 |
Refinement procedure
Resolution | 17.820 - 1.787 |
R-factor | 0.20577 |
Rwork | 0.204 |
R-free | 0.24494 |
Structure solution method | MOLECULAR REPLACEMENT |
Starting model (for MR) | 1rfx |
RMSD bond length | 0.008 |
RMSD bond angle | 1.844 |
Data reduction software | DENZO |
Data scaling software | SCALEPACK |
Phasing software | AMoRE |
Refinement software | REFMAC (5.1.9999) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 20.000 | 1.860 |
High resolution limit [Å] | 1.787 | 1.787 |
Rmerge | 0.083 | 0.249 |
Number of reflections | 21591 | |
<I/σ(I)> | 11.3 | 4.6 |
Completeness [%] | 98.4 | 100 |
Redundancy | 17.3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 5.5 | 277 | 40% MPD, 8% PEG 5000MME, 0.2M MgCl2, 0.1M Na Acetate pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K |