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1RGX

Crystal Structure of resisitin

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsAPS BEAMLINE 31-ID
Synchrotron siteAPS
Beamline31-ID
Temperature [K]110
Detector technologyCCD
Collection date2000-12-02
DetectorMACSCIENCE
Wavelength(s)1.0542517
Spacegroup nameC 1 2 1
Unit cell lengths49.021, 52.475, 96.609
Unit cell angles90.00, 96.53, 90.00
Refinement procedure
Resolution17.820 - 1.787
R-factor0.20577
Rwork0.204
R-free0.24494
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)1rfx
RMSD bond length0.008
RMSD bond angle1.844
Data reduction softwareDENZO
Data scaling softwareSCALEPACK
Phasing softwareAMoRE
Refinement softwareREFMAC (5.1.9999)
Data quality characteristics
 OverallOuter shell
Low resolution limit [Å]20.0001.860
High resolution limit [Å]1.7871.787
Rmerge0.0830.249
Number of reflections21591
<I/σ(I)>11.34.6
Completeness [%]98.4100
Redundancy17.3
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, HANGING DROP5.527740% MPD, 8% PEG 5000MME, 0.2M MgCl2, 0.1M Na Acetate pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 277K

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