14XX

Crystal Structure of FtsZ with Z142383342

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.319, 88.319, 177.801
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.199 - 2.068
Rwork	0.175
R-free	0.21440
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.684
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.160	2.104
High resolution limit [Å]	2.068	2.068
Rmerge	0.247	2.988
Rmeas	0.259	3.139
Rpim	0.076	0.959
Total number of observations	548245	25478
Number of reflections	47786	2390
<I/σ(I)>	8.4
Completeness [%]	100.0
Redundancy	11.5	10.7
CC(1/2)	0.996	0.326

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-571	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.