14XQ

Crystal Structure of FtsZ with Z453319206

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.318, 88.318, 177.783
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.198 - 1.982
Rwork	0.178
R-free	0.21220
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.687
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.159	2.016
High resolution limit [Å]	1.982	1.982
Rmerge	0.245	2.636
Rmeas	0.255	2.742
Rpim	0.070	0.755
Total number of observations	723200	35952
Number of reflections	54262	2717
<I/σ(I)>	9.3
Completeness [%]	100.0
Redundancy	13.3	13.2
CC(1/2)	0.997	0.375

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-532	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.