14XN

Crystal Structure of FtsZ with Z1416571195

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.479, 88.479, 178.640
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.279 - 1.878
Rwork	0.178
R-free	0.20910
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.008
RMSD bond angle	1.740
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.239	1.910
High resolution limit [Å]	1.878	1.878
Rmerge	0.222	3.210
Rmeas	0.230	3.334
Rpim	0.062	0.894
Total number of observations	860710	42911
Number of reflections	64366	3178
<I/σ(I)>	8.5
Completeness [%]	100.0
Redundancy	13.4	13.5
CC(1/2)	0.997	0.377

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-520	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.