14XB

Crystal Structure of FtsZ with Z275179758

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-07
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.222, 88.222, 177.694
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.150 - 1.908
Rwork	0.179
R-free	0.21680
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.009
RMSD bond angle	1.746
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.111	1.941
High resolution limit [Å]	1.908	1.908
Rmerge	0.177	2.833
Rmeas	0.184	2.945
Rpim	0.050	0.803
Total number of observations	809818	40441
Number of reflections	60616	3007
<I/σ(I)>	10.5
Completeness [%]	100.0
Redundancy	13.4	13.4
CC(1/2)	0.998	0.335

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-482	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.