14VP

Crystal Structure of FtsZ with Z1918536193

Experimental procedure

Experimental method	SINGLE WAVELENGTH
Source type	SYNCHROTRON
Source details	NSLS-II BEAMLINE 17-ID-1
Synchrotron site	NSLS-II
Beamline	17-ID-1
Temperature [K]	100
Detector technology	PIXEL
Collection date	2025-04-06
Detector	DECTRIS EIGER X 9M
Wavelength(s)	0.919764
Spacegroup name	P 65
Unit cell lengths	88.289, 88.289, 178.258
Unit cell angles	90.00, 90.00, 120.00

Refinement procedure

Resolution	44.184 - 2.219
Rwork	0.176
R-free	0.22260
Structure solution method	MOLECULAR REPLACEMENT
RMSD bond length	0.007
RMSD bond angle	1.591
Data reduction software	autoPROC (1.0.5)
Data scaling software	Aimless
Phasing software	DIMPLE
Refinement software	REFMAC (5.8.0430)

Data quality characteristics

	Overall	Outer shell
Low resolution limit [Å]	44.145	2.257
High resolution limit [Å]	2.219	2.219
Rmerge	0.323	2.829
Rmeas	0.336	2.940
Rpim	0.092	0.800
Total number of observations	522154	26444
Number of reflections	38827	1955
<I/σ(I)>	8.1
Completeness [%]	100.0
Redundancy	13.4	13.5
CC(1/2)	0.993	0.342

Crystallization Conditions

crystal ID	method	pH	temperature	details
ftsz-320	VAPOR DIFFUSION, SITTING DROP	5	294	0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0.