14UI
Crystal Structure of FtsZ with Z50145861
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-1 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2025-04-09 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 0.920051 |
| Spacegroup name | P 65 |
| Unit cell lengths | 88.224, 88.224, 177.858 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 44.151 - 2.481 |
| Rwork | 0.166 |
| R-free | 0.23470 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.571 |
| Data reduction software | autoPROC (1.0.5) |
| Data scaling software | Aimless |
| Phasing software | DIMPLE |
| Refinement software | REFMAC (5.8.0430) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 44.112 | 2.524 |
| High resolution limit [Å] | 2.481 | 2.481 |
| Rmerge | 0.257 | 2.029 |
| Rmeas | 0.268 | 2.120 |
| Rpim | 0.074 | 0.596 |
| Total number of observations | 349676 | 15689 |
| Number of reflections | 27676 | 1378 |
| <I/σ(I)> | 9.1 | |
| Completeness [%] | 100.0 | |
| Redundancy | 12.6 | 11.4 |
| CC(1/2) | 0.996 | 0.360 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| ftsz-1031 | VAPOR DIFFUSION, SITTING DROP | 5 | 294 | 0.1 M ammonium sulfate, 15.6% (w/v) PEG 3350, 0.1 M Bis-Tris pH 5.0. |






