EM specimen
| Vitrification | Yes |
EM Data Collection
| Microscope | TFS KRIOS |
| Electron Gun | OTHER |
| Accelerating Voltage (kV) | 300 |
| Detector | OTHER |
3D Reconstruction
| Method | SINGLE PARTICLE |
| Resolution (Å) | 3.1 |
| Software | cisTEM,ISOLDE,PHENIX,CTFFIND,UCSF ChimeraX |
| CTF correction | PHASE FLIPPING AND AMPLITUDE CORRECTION |






