11CY
Crystal structure of ZnO5_baseKO_ES
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-E |
| Synchrotron site | APS |
| Beamline | 24-ID-E |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2025-10-17 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97905 |
| Spacegroup name | H 3 |
| Unit cell lengths | 107.861, 107.861, 88.885 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 41.340 - 2.770 |
| R-factor | 0.2186 |
| Rwork | 0.216 |
| R-free | 0.25410 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.003 |
| RMSD bond angle | 0.439 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.21.2_5419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 64.390 | 2.920 |
| High resolution limit [Å] | 2.770 | 2.770 |
| Rmerge | 0.097 | 1.058 |
| Rpim | 0.034 | 0.354 |
| Number of reflections | 9789 | 1413 |
| <I/σ(I)> | 15 | 1.8 |
| Completeness [%] | 99.9 | 100 |
| Redundancy | 10.5 | 10.9 |
| CC(1/2) | 0.999 | 0.784 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 0.2 M Ammonium chloride and 40% (v/v) MPD |






