解像度: 2.401→13.753 Å / Cor.coef. Fo:Fc: 0.96 / Cor.coef. Fo:Fc free: 0.918 / SU B: 21.452 / SU ML: 0.236 / 交差検証法: THROUGHOUT / ESU R: 0.445 / ESU R Free: 0.297 / 詳細: Hydrogens have been added in their riding positions
Rfactor
反射数
%反射
Selection details
Rfree
0.2663
1075
14.455 %
RANDOM
Rwork
0.1938
6362
-
-
all
0.204
-
-
-
obs
0.20297
7437
97.279 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 50.562 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.213 Å2
-0.106 Å2
-0 Å2
2-
-
-0.213 Å2
0 Å2
3-
-
-
0.69 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.401→13.753 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1150
0
16
49
1215
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.011
0.013
1183
X-RAY DIFFRACTION
r_bond_other_d
0.001
0.017
1157
X-RAY DIFFRACTION
r_angle_refined_deg
1.779
1.644
1598
X-RAY DIFFRACTION
r_angle_other_deg
1.233
1.58
2671
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
7.94
5
146
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
37.42
25
48
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
18.301
15
208
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
8.348
15
3
X-RAY DIFFRACTION
r_chiral_restr
0.075
0.2
162
X-RAY DIFFRACTION
r_gen_planes_refined
0.009
0.02
1288
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
226
X-RAY DIFFRACTION
r_nbd_refined
0.198
0.2
203
X-RAY DIFFRACTION
r_symmetry_nbd_other
0.2
0.2
1014
X-RAY DIFFRACTION
r_nbtor_refined
0.159
0.2
514
X-RAY DIFFRACTION
r_symmetry_nbtor_other
0.086
0.2
576
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.138
0.2
43
X-RAY DIFFRACTION
r_symmetry_nbd_refined
0.137
0.2
8
X-RAY DIFFRACTION
r_nbd_other
0.243
0.2
27
X-RAY DIFFRACTION
r_symmetry_xyhbond_nbd_refined
0.108
0.2
3
X-RAY DIFFRACTION
r_mcbond_it
2.46
3.533
596
X-RAY DIFFRACTION
r_mcbond_other
2.46
3.532
595
X-RAY DIFFRACTION
r_mcangle_it
3.972
5.264
738
X-RAY DIFFRACTION
r_mcangle_other
3.97
5.265
739
X-RAY DIFFRACTION
r_scbond_it
2.456
3.782
587
X-RAY DIFFRACTION
r_scbond_other
2.454
3.785
588
X-RAY DIFFRACTION
r_scangle_it
4
5.545
860
X-RAY DIFFRACTION
r_scangle_other
3.997
5.547
861
X-RAY DIFFRACTION
r_lrange_it
5.954
40.189
1175
X-RAY DIFFRACTION
r_lrange_other
5.95
40.127
1174
LS精密化 シェル
Refine-ID: X-RAY DIFFRACTION / Total num. of bins used: 20
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Rfactor all
Num. reflection all
Fsc free
Fsc work
% reflection obs (%)
WRfactor Rwork
2.401-2.461
0.366
97
0.328
428
0.335
542
0.781
0.78
96.8635
0.315
2.461-2.527
0.348
58
0.287
437
0.294
513
0.694
0.804
96.4912
0.274
2.527-2.597
0.485
51
0.275
430
0.295
496
0.789
0.864
96.9758
0.252
2.597-2.674
0.361
66
0.279
438
0.29
519
0.825
0.864
97.1098
0.254
2.674-2.758
0.343
78
0.24
369
0.258
459
0.844
0.883
97.3856
0.213
2.758-2.851
0.337
67
0.225
394
0.241
473
0.86
0.895
97.463
0.201
2.851-2.954
0.279
76
0.204
368
0.216
453
0.901
0.926
98.0132
0.177
2.954-3.069
0.318
64
0.222
358
0.237
430
0.867
0.903
98.1395
0.2
3.069-3.198
0.285
54
0.21
356
0.221
418
0.9
0.916
98.0861
0.188
3.198-3.345
0.28
48
0.218
365
0.225
420
0.892
0.917
98.3333
0.201
3.345-3.514
0.291
48
0.205
319
0.216
373
0.903
0.931
98.3914
0.193
3.514-3.712
0.236
62
0.192
318
0.2
385
0.947
0.948
98.7013
0.181
3.712-3.948
0.26
43
0.19
295
0.199
342
0.925
0.946
98.8304
0.178
3.948-4.236
0.198
66
0.152
267
0.162
336
0.952
0.97
99.1071
0.142
4.236-4.596
0.151
42
0.114
259
0.12
302
0.979
0.98
99.6689
0.111
4.596-5.069
0.209
28
0.13
260
0.137
289
0.962
0.978
99.654
0.132
5.069-5.725
0.377
30
0.213
226
0.231
258
0.877
0.938
99.2248
0.205
5.725-6.726
0.419
33
0.214
201
0.238
237
0.861
0.938
98.7342
0.209
6.726-8.545
0.214
36
0.153
153
0.165
191
0.959
0.966
98.9529
0.159
8.545-13.753
0.227
26
0.184
117
0.193
150
0.953
0.965
95.3333
0.202
精密化 TLS
手法: refined / Origin x: 15.4893 Å / Origin y: 5.1748 Å / Origin z: 33.3413 Å