解像度: 1.82→36.758 Å / Cor.coef. Fo:Fc: 0.9543 / Cor.coef. Fo:Fc free: 0.9399 / SU R Cruickshank DPI: 0.119 / 交差検証法: THROUGHOUT / σ(F): 0 / SU R Blow DPI: 0.099 / SU Rfree Blow DPI: 0.099 / SU Rfree Cruickshank DPI: 0.101 詳細: WATERS ARE ORDERED FROM STRONGEST DENSITY TO WEAKEST DENSITY
Rfactor
反射数
%反射
Selection details
Rfree
0.24
6384
5.07 %
RANDOM
Rwork
0.204
-
-
-
obs
-
125942
95.97 %
-
原子変位パラメータ
Biso mean: 51.53 Å2
Baniso -1
Baniso -2
Baniso -3
1-
2.984 Å2
0 Å2
0 Å2
2-
-
-3.1658 Å2
0 Å2
3-
-
-
0.1817 Å2
Refine analyze
Luzzati coordinate error obs: 0.278 Å
精密化ステップ
サイクル: LAST / 解像度: 1.82→36.758 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
7102
0
32
503
7637
拘束条件
Refine-ID
タイプ
Dev ideal
数
Restraint function
Weight
X-RAY DIFFRACTION
t_bond_d
0.01
14430
HARMONIC
2
X-RAY DIFFRACTION
t_angle_deg
1.07
26084
HARMONIC
2
X-RAY DIFFRACTION
t_dihedral_angle_d
3145
SINUSOIDAL
2
X-RAY DIFFRACTION
t_trig_c_planes
200
HARMONIC
2
X-RAY DIFFRACTION
t_gen_planes
2121
HARMONIC
5
X-RAY DIFFRACTION
t_it
14430
HARMONIC
20
X-RAY DIFFRACTION
t_nbd
7
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_omega_torsion
3.86
X-RAY DIFFRACTION
t_other_torsion
15.22
X-RAY DIFFRACTION
t_chiral_improper_torsion
988
SEMIHARMONIC
5
X-RAY DIFFRACTION
t_ideal_dist_contact
16099
SEMIHARMONIC
4
LS精密化 シェル
解像度: 1.82→1.87 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.2202
398
4.79 %
Rwork
0.2151
7906
-
all
0.2153
8304
-
obs
-
-
95.97 %
精密化 TLS
手法: refined / Origin x: 26.1954 Å / Origin y: 22.8634 Å / Origin z: 120.513 Å