温度: 295 K / 手法: バッチ法 / pH: 4.7 詳細: HEWL co-crystallized with carboplatin (with DMSO added) in 1 mL 10% sodium chloride + 1 ml 0.04 M sodium acetate, pH 4.7, BATCH, temperature 295K
-
データ収集
回折
平均測定温度: 295 K
放射光源
由来: 回転陽極 / タイプ: BRUKER AXS MICROSTAR / 波長: 1.5418 Å
検出器
タイプ: APEX II CCD / 検出器: CCD / 日付: 2012年1月12日
放射
モノクロメーター: confocal mirror optics / プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
解像度: 2→56.025 Å / Cor.coef. Fo:Fc: 0.96 / Cor.coef. Fo:Fc free: 0.944 / SU B: 6.185 / SU ML: 0.092 / 交差検証法: THROUGHOUT / σ(F): 4 / σ(I): 2 / ESU R: 0.17 / ESU R Free: 0.149 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS U VALUES : WITH TLS ADDED
Rfactor
反射数
%反射
Selection details
Rfree
0.20319
404
4.7 %
RANDOM
Rwork
0.16061
-
-
-
obs
0.16249
8170
99.83 %
-
all
-
15602
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: BABINET MODEL WITH MASK
原子変位パラメータ
Biso mean: 19.186 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-0.17 Å2
0 Å2
-0 Å2
2-
-
-0.17 Å2
-0 Å2
3-
-
-
0.33 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→56.025 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1001
0
17
46
1064
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.018
0.019
1038
X-RAY DIFFRACTION
r_bond_other_d
0.005
0.02
708
X-RAY DIFFRACTION
r_angle_refined_deg
1.831
1.913
1402
X-RAY DIFFRACTION
r_angle_other_deg
1.096
3.009
1685
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.76
5
128
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
39.262
23
50
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
16.098
15
166
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
21.899
15
11
X-RAY DIFFRACTION
r_chiral_restr
0.122
0.2
145
X-RAY DIFFRACTION
r_gen_planes_refined
0.008
0.02
1172
X-RAY DIFFRACTION
r_gen_planes_other
0.001
0.02
235
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2→2.052 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.323
26
-
Rwork
0.165
498
-
obs
-
-
97.58 %
精密化 TLS
手法: refined / Origin x: -20.665 Å / Origin y: -0.6419 Å / Origin z: -9.2159 Å