DIPHTHERIATOXIN / DT / NAD(+)--DIPHTHAMIDE ADP-RIBOSYLTRANSFERASE / DIPHTHERIA TOXIN FRAGMENT A / DIPHTHERIA TOXIN ...DT / NAD(+)--DIPHTHAMIDE ADP-RIBOSYLTRANSFERASE / DIPHTHERIA TOXIN FRAGMENT A / DIPHTHERIA TOXIN FRAGMENT B / CRM197
COORDINATES USE STANDARD RESIDUE NUMBERING FOR CONSISTENCY WITH PREVIOUS WORK RESULTING IN THE ...COORDINATES USE STANDARD RESIDUE NUMBERING FOR CONSISTENCY WITH PREVIOUS WORK RESULTING IN THE NATURAL GLY TO GLU MUTATION AT POSITION 52 INSTEAD OF 53. RESIDUES 1-32 IN THE UNIPROT SEQUENCE ARE THE SIGNAL PEPTIDE.
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.86 Å3/Da / 溶媒含有率: 57 % / 解説: NONE
結晶化
pH: 9 / 詳細: 1.9 M AMMONIUM SULFATE, 100 MM BICINE [PH 9.0]
解像度: 1.996→41.335 Å / SU ML: 0.29 / σ(F): 0.21 / 位相誤差: 28.36 / 立体化学のターゲット値: ML 詳細: RESIDUES 1-4, 38-49, 188-200, 349-352, AND 517-519, ARE DISORDERED. DISORDERED SIDE CHAINS WERE MODELED UP TO THE BACKBONE CBETA ATOMS, AND RESIDUE NAMES WERE KEPT CONSISTENT WITH SEQUENCE OF THE PROTEIN.
Rfactor
反射数
%反射
Rfree
0.2411
1837
5 %
Rwork
0.2096
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-
obs
0.2112
36533
88.51 %
溶媒の処理
減衰半径: 0.9 Å / VDWプローブ半径: 1.11 Å / 溶媒モデル: FLAT BULK SOLVENT MODEL / Bsol: 49.666 Å2 / ksol: 0.3 e/Å3
原子変位パラメータ
Biso mean: 56 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-8.2649 Å2
0 Å2
-9.5035 Å2
2-
-
15.4835 Å2
0 Å2
3-
-
-
-7.2187 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.996→41.335 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
3664
0
0
169
3833
拘束条件
Refine-ID
タイプ
Dev ideal
数
X-RAY DIFFRACTION
f_bond_d
0.007
3735
X-RAY DIFFRACTION
f_angle_d
0.961
5082
X-RAY DIFFRACTION
f_dihedral_angle_d
12.271
1287
X-RAY DIFFRACTION
f_chiral_restr
0.067
590
X-RAY DIFFRACTION
f_plane_restr
0.004
664
LS精密化 シェル
解像度 (Å)
Rfactor Rfree
Num. reflection Rfree
Rfactor Rwork
Num. reflection Rwork
Refine-ID
% reflection obs (%)
1.9958-2.0671
0.305
96
0.2699
2137
X-RAY DIFFRACTION
55
2.0671-2.1499
0.3065
163
0.2466
2985
X-RAY DIFFRACTION
77
2.1499-2.2477
0.2805
173
0.2238
3318
X-RAY DIFFRACTION
85
2.2477-2.3662
0.2433
176
0.2123
3463
X-RAY DIFFRACTION
89
2.3662-2.5145
0.2843
186
0.2149
3605
X-RAY DIFFRACTION
92
2.5145-2.7086
0.2586
204
0.2135
3735
X-RAY DIFFRACTION
95
2.7086-2.9811
0.2735
190
0.2175
3829
X-RAY DIFFRACTION
97
2.9811-3.4123
0.2435
212
0.2202
3870
X-RAY DIFFRACTION
99
3.4123-4.2984
0.2122
211
0.1885
3906
X-RAY DIFFRACTION
99
4.2984-41.3437
0.2216
226
0.1927
3848
X-RAY DIFFRACTION
97
精密化 TLS
手法: refined / Origin x: -15.9226 Å / Origin y: 24.0845 Å / Origin z: 27.364 Å