解像度: 1.52→1.57 Å / 冗長度: 13.5 % / Rmerge(I) obs: 0.375 / Mean I/σ(I) obs: 6.9 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
SHELX
モデル構築
REFMAC
5.5.0102
精密化
HKL-2000
データ削減
HKL-2000
データスケーリング
SHELX
位相決定
精密化
構造決定の手法: 単波長異常分散 / 解像度: 1.52→67.42 Å / Cor.coef. Fo:Fc: 0.963 / Cor.coef. Fo:Fc free: 0.953 / SU B: 2.229 / SU ML: 0.038 / 交差検証法: THROUGHOUT / ESU R: 0.067 / ESU R Free: 0.069 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.20136
1135
5.1 %
RANDOM
Rwork
0.17432
-
-
-
obs
0.17568
21062
99.94 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 20.987 Å2
精密化ステップ
サイクル: LAST / 解像度: 1.52→67.42 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
895
0
5
141
1041
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.008
0.022
920
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.219
1.936
1249
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.339
5
116
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.827
24.889
45
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
14.039
15
158
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.541
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.088
0.2
141
X-RAY DIFFRACTION
r_gen_planes_refined
0.004
0.02
694
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.659
1.5
574
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.256
2
925
X-RAY DIFFRACTION
r_scbond_it
1.98
3
346
X-RAY DIFFRACTION
r_scangle_it
3.172
4.5
323
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 1.52→1.561 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.224
80
-
Rwork
0.213
1550
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: 31.9499 Å / Origin y: 24.3754 Å / Origin z: -1.7461 Å