解像度: 2.12→45.49 Å / Cor.coef. Fo:Fc: 0.955 / Cor.coef. Fo:Fc free: 0.94 / SU B: 7.525 / SU ML: 0.104 / 交差検証法: THROUGHOUT / σ(F): 0 / ESU R: 0.182 / ESU R Free: 0.155 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: ATOM RECORD CONTAINS SUM OF TLS AND RESIDUAL B FACTORS. ANISOU RECORD CONTAINS SUM OF TLS AND RESIDUAL U FACTORS.
Rfactor
反射数
%反射
Selection details
Rfree
0.21477
420
5 %
RANDOM
Rwork
0.18734
-
-
-
all
0.1887
8384
-
-
obs
0.1887
7964
100 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 33.912 Å2
Baniso -1
Baniso -2
Baniso -3
1-
1.38 Å2
0 Å2
0 Å2
2-
-
1.38 Å2
0 Å2
3-
-
-
-2.76 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.12→45.49 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
830
0
16
34
880
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.024
0.022
872
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
2.423
1.987
1178
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
5.952
5
104
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
33.781
21.176
34
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
20.948
15
159
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
17.034
15
10
X-RAY DIFFRACTION
r_chiral_restr
0.215
0.2
132
X-RAY DIFFRACTION
r_gen_planes_refined
0.011
0.021
646
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.055
0.2
5045
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
X-RAY DIFFRACTION
r_scbond_it
X-RAY DIFFRACTION
r_scangle_it
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.12→2.175 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.368
31
-
Rwork
0.228
574
-
obs
-
-
100 %
精密化 TLS
手法: refined / Origin x: 10.1396 Å / Origin y: 21.323 Å / Origin z: 14.7529 Å