ソフトウェア 名称 バージョン 分類 MOLREP位相決定 REFMAC5.5.0088精密化
精密化 構造決定の手法 : 分子置換開始モデル : PDB entry 1IGW解像度 : 2.69→48.91 Å / Cor.coef. Fo :Fc : 0.922 / Cor.coef. Fo :Fc free : 0.867 / SU B : 15.524 / SU ML : 0.314 / 交差検証法 : THROUGHOUT / σ(F) : 0 / ESU R Free : 0.401 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THERfactor 反射数 %反射 Selection details Rfree 0.277 2426 5.1 % RANDOM Rwork 0.213 - - - obs 0.216 47959 - -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : MASK原子変位パラメータ Biso mean : 31.2 Å2 Baniso -1 Baniso -2 Baniso -3 1- -1.2 Å2 0 Å2 0 Å2 2- - 2.86 Å2 0 Å2 3- - - -1.66 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.69→48.91 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 12580 0 0 150 12730
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.008 0.022 12853 X-RAY DIFFRACTION r_bond_other_d0.001 0.02 8494 X-RAY DIFFRACTION r_angle_refined_deg1.019 1.941 17435 X-RAY DIFFRACTION r_angle_other_deg0.815 3 20693 X-RAY DIFFRACTION r_dihedral_angle_1_deg5.108 5 1644 X-RAY DIFFRACTION r_dihedral_angle_2_deg35.812 24.722 593 X-RAY DIFFRACTION r_dihedral_angle_3_deg15.073 15 2038 X-RAY DIFFRACTION r_dihedral_angle_4_deg13.746 15 62 X-RAY DIFFRACTION r_chiral_restr0.055 0.2 1904 X-RAY DIFFRACTION r_gen_planes_refined0.004 0.02 14680 X-RAY DIFFRACTION r_gen_planes_other0.001 0.02 2650 X-RAY DIFFRACTION r_nbd_refinedX-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refinedX-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refinedX-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refinedX-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refinedX-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.308 1.5 8160 X-RAY DIFFRACTION r_mcbond_other0.056 1.5 3368 X-RAY DIFFRACTION r_mcangle_it0.577 2 12937 X-RAY DIFFRACTION r_scbond_it0.671 3 4693 X-RAY DIFFRACTION r_scangle_it1.146 4.5 4498 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
Refine LS restraints NCS Ens-ID : 1 / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (6 x 16) 大きな表を隠す Dom-ID Auth asym-ID 数 タイプ Rms dev position (Å)Weight position 1 A2422 medium positional0.16 0.5 2 B2422 medium positional0.16 0.5 3 C2422 medium positional0.16 0.5 4 D2422 medium positional0.17 0.5 1 A2749 loose positional0.28 5 2 B2749 loose positional0.31 5 3 C2749 loose positional0.31 5 4 D2749 loose positional0.28 5 1 A2422 medium thermal0.32 2 2 B2422 medium thermal0.24 2 3 C2422 medium thermal0.24 2 4 D2422 medium thermal0.22 2 1 A2749 loose thermal0.32 10 2 B2749 loose thermal0.28 10 3 C2749 loose thermal0.28 10 4 D2749 loose thermal0.26 10
LS精密化 シェル 解像度 : 2.69→2.76 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.463 173 - Rwork 0.344 3219 - obs - - 96.5 %