構造決定の手法: 単波長異常分散 / 解像度: 2.35→41.88 Å / Cor.coef. Fo:Fc: 0.948 / Cor.coef. Fo:Fc free: 0.916 / SU B: 14.094 / SU ML: 0.15 / 交差検証法: THROUGHOUT / ESU R: 1.078 / ESU R Free: 0.205 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.26014
5174
5 %
RANDOM
Rwork
0.21089
-
-
-
obs
0.21332
98462
99.47 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 46.425 Å2
Baniso -1
Baniso -2
Baniso -3
1-
2.9 Å2
-0 Å2
0 Å2
2-
-
-2.03 Å2
0 Å2
3-
-
-
-0.87 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.35→41.88 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
10423
0
60
269
10752
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.011
0.021
10543
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.384
1.955
14323
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
4.909
5
1349
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.338
22.084
475
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
20.036
15
1646
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.881
15
123
X-RAY DIFFRACTION
r_chiral_restr
0.098
0.2
1662
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
7961
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.824
1.5
6747
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.508
2
10626
X-RAY DIFFRACTION
r_scbond_it
2.005
3
3796
X-RAY DIFFRACTION
r_scangle_it
3.269
4.5
3694
X-RAY DIFFRACTION
r_rigid_bond_restr
1.286
3
10543
X-RAY DIFFRACTION
r_sphericity_free
5.142
3
288
X-RAY DIFFRACTION
r_sphericity_bonded
2.151
3
10392
LS精密化 シェル
解像度: 2.35→2.411 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.329
394
-
Rwork
0.273
7192
-
obs
-
-
99.97 %
精密化 TLS
手法: refined / Origin x: -10.729 Å / Origin y: 152.037 Å / Origin z: 28.625 Å