ソフトウェア 名称 バージョン 分類 MAR345CCDデータ収集 PHASER位相決定 REFMAC5.2.0019精密化 HKL-2000データ削減 HKL-2000データスケーリング
精密化 構造決定の手法 : 分子置換開始モデル : PDB entry 2GJZ解像度 : 2.5→32.39 Å / Cor.coef. Fo :Fc : 0.941 / Cor.coef. Fo :Fc free : 0.915 / SU B : 25.291 / SU ML : 0.265 / TLS residual ADP flag : LIKELY RESIDUAL / 交差検証法 : THROUGHOUT / ESU R : 0.856 / ESU R Free : 0.335 / 立体化学のターゲット値 : MAXIMUM LIKELIHOOD / 詳細 : HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONSRfactor 反射数 %反射 Selection details Rfree 0.27684 800 5.1 % RANDOM Rwork 0.2187 - - - obs 0.22163 14790 99.59 % -
溶媒の処理 イオンプローブ半径 : 0.8 Å / 減衰半径 : 0.8 Å / VDWプローブ半径 : 1.2 Å / 溶媒モデル : BABINET MODEL WITH MASK原子変位パラメータ Biso mean : 55.185 Å2 Baniso -1 Baniso -2 Baniso -3 1- 2.7 Å2 0 Å2 0 Å2 2- - -4.93 Å2 0 Å2 3- - - 2.22 Å2
精密化ステップ サイクル : LAST / 解像度 : 2.5→32.39 Åタンパク質 核酸 リガンド 溶媒 全体 原子数 3269 0 25 49 3343
拘束条件 大きな表を表示 (5 x 33) 大きな表を隠す Refine-ID タイプ Dev ideal Dev ideal target 数 X-RAY DIFFRACTION r_bond_refined_d0.012 0.022 3378 X-RAY DIFFRACTION r_bond_other_dX-RAY DIFFRACTION r_angle_refined_deg1.409 1.962 4601 X-RAY DIFFRACTION r_angle_other_degX-RAY DIFFRACTION r_dihedral_angle_1_deg6.67 5 427 X-RAY DIFFRACTION r_dihedral_angle_2_deg36.786 24.766 128 X-RAY DIFFRACTION r_dihedral_angle_3_deg17.004 15 534 X-RAY DIFFRACTION r_dihedral_angle_4_deg20.128 15 9 X-RAY DIFFRACTION r_chiral_restr0.086 0.2 516 X-RAY DIFFRACTION r_gen_planes_refined0.004 0.02 2535 X-RAY DIFFRACTION r_gen_planes_otherX-RAY DIFFRACTION r_nbd_refined0.208 0.2 1287 X-RAY DIFFRACTION r_nbd_otherX-RAY DIFFRACTION r_nbtor_refined0.303 0.2 2195 X-RAY DIFFRACTION r_nbtor_otherX-RAY DIFFRACTION r_xyhbond_nbd_refined0.143 0.2 152 X-RAY DIFFRACTION r_xyhbond_nbd_otherX-RAY DIFFRACTION r_metal_ion_refinedX-RAY DIFFRACTION r_metal_ion_otherX-RAY DIFFRACTION r_symmetry_vdw_refined0.222 0.2 31 X-RAY DIFFRACTION r_symmetry_vdw_otherX-RAY DIFFRACTION r_symmetry_hbond_refined0.209 0.2 4 X-RAY DIFFRACTION r_symmetry_hbond_otherX-RAY DIFFRACTION r_symmetry_metal_ion_refinedX-RAY DIFFRACTION r_symmetry_metal_ion_otherX-RAY DIFFRACTION r_mcbond_it0.597 1.5 2190 X-RAY DIFFRACTION r_mcbond_otherX-RAY DIFFRACTION r_mcangle_it0.754 2 3466 X-RAY DIFFRACTION r_scbond_it1.364 3 1388 X-RAY DIFFRACTION r_scangle_it2.039 4.5 1135 X-RAY DIFFRACTION r_rigid_bond_restrX-RAY DIFFRACTION r_sphericity_freeX-RAY DIFFRACTION r_sphericity_bonded
LS精密化 シェル 解像度 : 2.5→2.565 Å / Total num. of bins used : 20 Rfactor 反射数 %反射 Rfree 0.389 61 - Rwork 0.338 1061 - obs - - 98.85 %
精密化 TLS 手法 : refined / Refine-ID : X-RAY DIFFRACTION
大きな表を表示 (25 x 4) 大きな表を隠す ID L11 (°2 )L12 (°2 )L13 (°2 )L22 (°2 )L23 (°2 )L33 (°2 )S11 (Å °)S12 (Å °)S13 (Å °)S21 (Å °)S22 (Å °)S23 (Å °)S31 (Å °)S32 (Å °)S33 (Å °)T11 (Å2 )T12 (Å2 )T13 (Å2 )T22 (Å2 )T23 (Å2 )T33 (Å2 )Origin x (Å)Origin y (Å)Origin z (Å)1 3.3856 1.9969 -0.3534 5.7093 -1.2917 2.6074 -0.023 0.2567 -0.1248 -0.4151 -0.0206 0.037 0.2236 -0.1896 0.0437 -0.1773 0.0406 -0.0053 -0.0998 -0.0424 -0.0239 11.8058 -9.1594 -38.3325 2 2.2339 0.4644 -1.6403 3.0598 0.4378 9.6273 0.3959 -0.2524 -0.1016 0.8945 -0.1255 0.287 -0.3835 -0.8926 -0.2704 0.0148 -0.0812 0.0327 -0.0027 0.069 0.0951 -3.4809 -28.2564 -9.3827 3 2.5494 -0.1687 -2.0244 2.2368 0.3523 3.7595 0.009 0.0009 0.0973 0.2747 -0.0423 -0.2658 -0.1119 -0.0185 0.0333 -0.192 -0.0206 -0.0793 -0.1684 0.0441 0.0514 19.4013 2.5717 -21.9344 4 2.6533 -4.0583 -1.4807 9.7522 2.0771 2.6618 -0.0859 -0.2531 -0.1249 0.9368 0.0798 -0.4387 0.1148 0.2555 0.0061 0.1273 -0.0812 -0.0988 -0.0361 0.0027 -0.083 11.5195 -21.6428 -5.177
精密化 TLSグループ ID Refine-ID Refine TLS-ID Auth asym-ID Auth seq-ID 1 X-RAY DIFFRACTION 1 L1 - 107 2 X-RAY DIFFRACTION 2 L108 - 211 3 X-RAY DIFFRACTION 3 H1 - 113 4 X-RAY DIFFRACTION 4 H114 - 227