SHEET DETERMINATION METHOD: DSSP THE SHEETS PRESENTED AS "AA" IN EACH CHAIN ON SHEET RECORDS BELOW ... SHEET DETERMINATION METHOD: DSSP THE SHEETS PRESENTED AS "AA" IN EACH CHAIN ON SHEET RECORDS BELOW IS ACTUALLY AN 8-STRANDED BARREL THIS IS REPRESENTED BY A 9-STRANDED SHEET IN WHICH THE FIRST AND LAST STRANDS ARE IDENTICAL. THE SHEETS PRESENTED AS "BA" IN EACH CHAIN ON SHEET RECORDS BELOW IS ACTUALLY AN 8-STRANDED BARREL THIS IS REPRESENTED BY A 9-STRANDED SHEET IN WHICH THE FIRST AND LAST STRANDS ARE IDENTICAL.
ENGINEERED RESIDUE IN CHAIN A, ASN 15 TO SER ENGINEERED RESIDUE IN CHAIN A, GLN 18 TO PRO ...ENGINEERED RESIDUE IN CHAIN A, ASN 15 TO SER ENGINEERED RESIDUE IN CHAIN A, GLN 18 TO PRO ENGINEERED RESIDUE IN CHAIN A, GLN 19 TO ASP ENGINEERED RESIDUE IN CHAIN A, ILE 68 TO GLY ENGINEERED RESIDUE IN CHAIN A, ALA 69 TO ASN ENGINEERED RESIDUE IN CHAIN A, LYS 70 TO ALA ENGINEERED RESIDUE IN CHAIN A, SER 71 TO ASP ENGINEERED RESIDUE IN CHAIN A, GLY 72 TO ALA ENGINEERED RESIDUE IN CHAIN A, PRO 81 TO ALA ENGINEERED RESIDUE IN CHAIN A, ILE 82 TO SER ENGINEERED RESIDUE IN CHAIN A, ALA 100 TO TRP ENGINEERED RESIDUE IN CHAIN A, VAL 233 TO ALA ENGINEERED RESIDUE IN CHAIN B, ASN 15 TO SER ENGINEERED RESIDUE IN CHAIN B, GLN 18 TO PRO ENGINEERED RESIDUE IN CHAIN B, GLN 19 TO ASP ENGINEERED RESIDUE IN CHAIN B, ILE 68 TO GLY ENGINEERED RESIDUE IN CHAIN B, ALA 69 TO ASN ENGINEERED RESIDUE IN CHAIN B, LYS 70 TO ALA ENGINEERED RESIDUE IN CHAIN B, SER 71 TO ASP ENGINEERED RESIDUE IN CHAIN B, GLY 72 TO ALA ENGINEERED RESIDUE IN CHAIN B, PRO 81 TO ALA ENGINEERED RESIDUE IN CHAIN B, ILE 82 TO SER ENGINEERED RESIDUE IN CHAIN B, ALA 100 TO TRP ENGINEERED RESIDUE IN CHAIN B, VAL 233 TO ALA
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実験情報
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実験
実験
手法: X線回折 / 使用した結晶の数: 1
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試料調製
結晶
マシュー密度: 2.24 Å3/Da / 溶媒含有率: 45 % / 解説: NONE
結晶化
pH: 5.5 / 詳細: 20% PEG6000, 0.1M CITRATE, PH 5.5
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データ収集
回折
平均測定温度: 100 K
放射光源
由来: 回転陽極 / タイプ: ENRAF-NONIUS FR591 / 波長: 1.5418
検出器
タイプ: MAR scanner 345 mm plate / 検出器: IMAGE PLATE / 日付: 2009年11月30日 / 詳細: MONTEL MIRRORS
放射
プロトコル: SINGLE WAVELENGTH / 単色(M)・ラウエ(L): M / 散乱光タイプ: x-ray
放射波長
波長: 1.5418 Å / 相対比: 1
反射
解像度: 1.9→15 Å / Num. obs: 32859 / % possible obs: 99 % / Observed criterion σ(I): 3 / 冗長度: 3.6 % / Biso Wilson estimate: 20.22 Å2 / Rmerge(I) obs: 0.11 / Net I/σ(I): 13.5
反射 シェル
解像度: 1.9→1.95 Å / 冗長度: 3.4 % / Rmerge(I) obs: 0.7 / Mean I/σ(I) obs: 2.9 / % possible all: 98.9