解像度: 2→2.02 Å / 冗長度: 7.1 % / Rmerge(I) obs: 0.299 / Mean I/σ(I) obs: 6.83 / Num. unique all: 206 / Rsym value: 0.298 / % possible all: 100
-
解析
ソフトウェア
名称
バージョン
分類
REFMAC
5.2.0005
精密化
HKL-2000
データ収集
HKL-2000
データ削減
HKL-2000
データスケーリング
HKL-3000
位相決定
SHELXD
位相決定
SHELXE
モデル構築
MLPHARE
位相決定
直接法
位相決定
CCP4
位相決定
SOLVE
位相決定
RESOLVE
位相決定
ARP/wARP
モデル構築
Coot
モデル構築
O
モデル構築
精密化
構造決定の手法: 単波長異常分散 / 解像度: 2→33.79 Å / Cor.coef. Fo:Fc: 0.96 / Cor.coef. Fo:Fc free: 0.96 / SU B: 6.984 / SU ML: 0.1 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / σ(F): 0 / σ(I): 0 / ESU R: 0.168 / ESU R Free: 0.141 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD 詳細: COOT HAS ALSO BEEN A SOFTWARE USED IN THE REFINEMENT. HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.20189
451
4.8 %
RANDOM
Rwork
0.17472
-
-
-
obs
0.17603
8989
99.73 %
-
all
-
9449
-
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.2 Å / 溶媒モデル: MASK
原子変位パラメータ
Biso mean: 33.113 Å2
Baniso -1
Baniso -2
Baniso -3
1-
0.86 Å2
0.43 Å2
0 Å2
2-
-
0.86 Å2
0 Å2
3-
-
-
-1.29 Å2
精密化ステップ
サイクル: LAST / 解像度: 2→33.79 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
929
0
8
92
1029
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.02
0.022
984
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.605
1.982
1339
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.365
5
131
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
35.018
25.435
46
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
13.601
15
176
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
13.223
15
6
X-RAY DIFFRACTION
r_chiral_restr
0.101
0.2
157
X-RAY DIFFRACTION
r_gen_planes_refined
0.007
0.02
748
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.202
0.2
486
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.297
0.2
689
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.155
0.2
60
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.214
0.2
44
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.223
0.2
18
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
1.254
1.5
650
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
1.558
2
999
X-RAY DIFFRACTION
r_scbond_it
3.622
3
375
X-RAY DIFFRACTION
r_scangle_it
4.779
4.5
334
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2→2.05 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.265
31
-
Rwork
0.197
663
-
obs
-
-
99 %
精密化 TLS
手法: refined / Origin x: -14.168 Å / Origin y: 45.495 Å / Origin z: 2.91 Å