解像度: 2.7→40.28 Å / Cor.coef. Fo:Fc: 0.942 / Cor.coef. Fo:Fc free: 0.889 / SU B: 38.683 / SU ML: 0.383 / TLS residual ADP flag: LIKELY RESIDUAL / 交差検証法: THROUGHOUT / ESU R Free: 0.416 / 立体化学のターゲット値: MAXIMUM LIKELIHOOD / 詳細: HYDROGENS HAVE BEEN ADDED IN THE RIDING POSITIONS
Rfactor
反射数
%反射
Selection details
Rfree
0.292
324
4.729 %
RANDOM
Rwork
0.206
-
-
-
obs
0.21
6852
99.4 %
-
溶媒の処理
イオンプローブ半径: 0.8 Å / 減衰半径: 0.8 Å / VDWプローブ半径: 1.4 Å / 溶媒モデル: MASK BULK SOLVENT
原子変位パラメータ
Biso mean: 52.48 Å2
Baniso -1
Baniso -2
Baniso -3
1-
-4.304 Å2
-2.152 Å2
0 Å2
2-
-
-4.304 Å2
0 Å2
3-
-
-
6.456 Å2
精密化ステップ
サイクル: LAST / 解像度: 2.7→40.28 Å
タンパク質
核酸
リガンド
溶媒
全体
原子数
1625
0
24
61
1710
拘束条件
Refine-ID
タイプ
Dev ideal
Dev ideal target
数
X-RAY DIFFRACTION
r_bond_refined_d
0.019
0.022
1739
X-RAY DIFFRACTION
r_bond_other_d
X-RAY DIFFRACTION
r_angle_refined_deg
1.619
1.999
2376
X-RAY DIFFRACTION
r_angle_other_deg
X-RAY DIFFRACTION
r_dihedral_angle_1_deg
6.702
5
230
X-RAY DIFFRACTION
r_dihedral_angle_2_deg
34.735
26.957
69
X-RAY DIFFRACTION
r_dihedral_angle_3_deg
17.876
15
308
X-RAY DIFFRACTION
r_dihedral_angle_4_deg
19.281
15
1
X-RAY DIFFRACTION
r_chiral_restr
0.097
0.2
275
X-RAY DIFFRACTION
r_gen_planes_refined
0.005
0.02
1279
X-RAY DIFFRACTION
r_gen_planes_other
X-RAY DIFFRACTION
r_nbd_refined
0.241
0.2
835
X-RAY DIFFRACTION
r_nbd_other
X-RAY DIFFRACTION
r_nbtor_refined
0.318
0.2
1157
X-RAY DIFFRACTION
r_nbtor_other
X-RAY DIFFRACTION
r_xyhbond_nbd_refined
0.199
0.2
82
X-RAY DIFFRACTION
r_xyhbond_nbd_other
X-RAY DIFFRACTION
r_metal_ion_refined
X-RAY DIFFRACTION
r_metal_ion_other
X-RAY DIFFRACTION
r_symmetry_vdw_refined
0.197
0.2
20
X-RAY DIFFRACTION
r_symmetry_vdw_other
X-RAY DIFFRACTION
r_symmetry_hbond_refined
0.165
0.2
6
X-RAY DIFFRACTION
r_symmetry_hbond_other
X-RAY DIFFRACTION
r_symmetry_metal_ion_refined
X-RAY DIFFRACTION
r_symmetry_metal_ion_other
X-RAY DIFFRACTION
r_mcbond_it
0.474
1.5
1119
X-RAY DIFFRACTION
r_mcbond_other
X-RAY DIFFRACTION
r_mcangle_it
0.843
2
1756
X-RAY DIFFRACTION
r_scbond_it
1.251
3
707
X-RAY DIFFRACTION
r_scangle_it
2.095
4.5
611
X-RAY DIFFRACTION
r_rigid_bond_restr
X-RAY DIFFRACTION
r_sphericity_free
X-RAY DIFFRACTION
r_sphericity_bonded
LS精密化 シェル
解像度: 2.7→2.77 Å / Total num. of bins used: 20
Rfactor
反射数
%反射
Rfree
0.54
26
-
Rwork
0.345
463
-
obs
-
-
98.39 %
精密化 TLS
手法: refined / Origin x: -30.481 Å / Origin y: 21.691 Å / Origin z: 1.852 Å