| ソフトウェア | | 名称 | バージョン | 分類 |
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| XENGEN | | データ収集 | | SCALEK | (XENGEN)| データ削減 | X-PLOR | 3.1 | モデル構築 | X-PLOR | 3.1 | 精密化 | | XENGEN | | データ削減 | | SCALEK | (XENGEN)| データスケーリング | X-PLOR | 3.1 | 位相決定 | | |
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| 精密化 | 構造決定の手法: 分子置換 開始モデル: PDB ENTRY 1BBD 解像度: 2.8→7 Å / Isotropic thermal model: GROUP / σ(F): 2 / | Rfactor | 反射数 | %反射 |
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| Rwork | 0.195 | - | - |
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| obs | 0.195 | 8184 | 86.6 % |
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| 原子変位パラメータ | Biso mean: 14.6 Å2 |
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| Refine analyze | Luzzati coordinate error obs: 0.28 Å / Luzzati d res low obs: 5 Å |
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| 精密化ステップ | サイクル: LAST / 解像度: 2.8→7 Å
| タンパク質 | 核酸 | リガンド | 溶媒 | 全体 |
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| 原子数 | 3254 | 0 | 0 | 10 | 3264 |
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| 拘束条件 | | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_bond_d| 0.015 | | X-RAY DIFFRACTION | x_bond_d_na | | X-RAY DIFFRACTION | x_bond_d_prot | | X-RAY DIFFRACTION | x_angle_d | | X-RAY DIFFRACTION | x_angle_d_na | | X-RAY DIFFRACTION | x_angle_d_prot | | X-RAY DIFFRACTION | x_angle_deg| 2.1 | | X-RAY DIFFRACTION | x_angle_deg_na | | X-RAY DIFFRACTION | x_angle_deg_prot | | X-RAY DIFFRACTION | x_dihedral_angle_d| 28.2 | | X-RAY DIFFRACTION | x_dihedral_angle_d_na | | X-RAY DIFFRACTION | x_dihedral_angle_d_prot | | X-RAY DIFFRACTION | x_improper_angle_d| 1.95 | | X-RAY DIFFRACTION | x_improper_angle_d_na | | X-RAY DIFFRACTION | x_improper_angle_d_prot | | X-RAY DIFFRACTION | x_mcbond_it | | X-RAY DIFFRACTION | x_mcangle_it | | X-RAY DIFFRACTION | x_scbond_it | | X-RAY DIFFRACTION | x_scangle_it | | | | | | | | | | | | | | | | | | | |
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| LS精密化 シェル | 解像度: 2.8→2.96 Å / Total num. of bins used: 6 / | Rfactor | 反射数 |
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| Rwork | 0.255 | 389 |
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| Xplor file | | Refine-ID | Serial no | Param file | Topol file |
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| X-RAY DIFFRACTION | 1 | PARHCSDX.PROTOPHCSDX.PRO| X-RAY DIFFRACTION | 2 | PARAM.H2O| TOPOL.H2O | | | |
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| ソフトウェア | *PLUS 名称: X-PLOR / バージョン: 3.1 / 分類: refinement |
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| 精密化 | *PLUS 最低解像度: 8 Å / Num. reflection obs: 9420 |
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| 溶媒の処理 | *PLUS |
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| 原子変位パラメータ | *PLUS |
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| 拘束条件 | *PLUS | Refine-ID | タイプ | Dev ideal |
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| X-RAY DIFFRACTION | x_dihedral_angle_d | | X-RAY DIFFRACTION | x_dihedral_angle_deg| 28.2 | | X-RAY DIFFRACTION | x_improper_angle_d | | X-RAY DIFFRACTION | x_improper_angle_deg| 1.95 | | | | |
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