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8GV2

Crystal structure of anti-FX IgG fab without FAST-Ig mutations

Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsSPRING-8 BEAMLINE BL45XU
Synchrotron siteSPring-8
BeamlineBL45XU
Temperature [K]100
Detector technologyPIXEL
Collection date2021-10-23
DetectorDECTRIS PILATUS3 6M
Wavelength(s)1.00000
Spacegroup nameC 1 2 1
Unit cell lengths85.512, 62.289, 81.589
Unit cell angles90.00, 106.15, 90.00
Refinement procedure
Resolution49.630 - 1.274
R-factor0.1956
Rwork0.195
R-free0.21500
Structure solution methodMOLECULAR REPLACEMENT
Starting model (for MR)5dk3
RMSD bond length0.013
RMSD bond angle1.260
Data reduction softwareXDS (Jan 31, 2020)
Data scaling softwareAimless (0.7.7)
Phasing softwarePHASER
Refinement softwareBUSTER (2.11.8 (8-JUN-2022))
Data quality characteristics
 OverallInner shellOuter shell
Low resolution limit [Å]49.63249.6321.348
High resolution limit [Å]1.2743.6431.274
Rmerge0.0410.0270.900
Rmeas0.0470.0311.036
Rpim0.0220.0150.508
Total number of observations4043961977718892
Number of reflections9397346984697
<I/σ(I)>14.3243.781.36
Completeness [%]94.299.551.3
Completeness (spherical) [%]87.699.528.4
Completeness (ellipsoidal) [%]94.299.551.3
Redundancy4.34.214.02
CC(1/2)0.9990.9980.545
Anomalous completeness (spherical)84.797.927.4
Anomalous completeness91.297.949.6
Anomalous redundancy2.22.22.1
CC(ano)-0.165-0.200-0.020
|DANO|/σ(DANO)0.70.70.7
Diffraction limitsPrincipal axes of ellipsoid fitted to diffraction cut-off surface
1.273 Å0.811, 0.811, 0.811
1.310 Å0.000, 0.000, 0.000
1.339 Å0.586, 0.586, 0.586
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP29320.0 %w/v Polyethylene glycol 3350 [PEG 3350], 0.2 M Potassium formate [KFormate]

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PDB entries from 2024-05-15

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