4WLZ
Crystal structure of mouse Xyloside xylosyltransferase 1 complexed with manganese and UDP
Summary for 4WLZ
Entry DOI | 10.2210/pdb4wlz/pdb |
Related | 4WLG 4WLM 4WM0 4WMA 4WMB |
Descriptor | Xyloside xylosyltransferase 1, MANGANESE (II) ION, URIDINE-5'-DIPHOSPHATE, ... (4 entities in total) |
Functional Keywords | glycosyltransferase, transferase |
Biological source | Mus musculus (Mouse) |
Cellular location | Endoplasmic reticulum membrane ; Single-pass type II membrane protein : Q3U4G3 |
Total number of polymer chains | 2 |
Total formula weight | 71605.26 |
Authors | |
Primary citation | Yu, H.,Takeuchi, M.,LeBarron, J.,Kantharia, J.,London, E.,Bakker, H.,Haltiwanger, R.S.,Li, H.,Takeuchi, H. Notch-modifying xylosyltransferase structures support an SNi-like retaining mechanism. Nat.Chem.Biol., 11:847-854, 2015 Cited by PubMed Abstract: A major question remaining in glycobiology is how a glycosyltransferase (GT) that retains the anomeric linkage of a sugar catalyzes the reaction. Xyloside α-1,3-xylosyltransferase (XXYLT1) is a retaining GT that regulates Notch receptor activation by adding xylose to the Notch extracellular domain. Here, using natural acceptor and donor substrates and active Mus musculus XXYLT1, we report a series of crystallographic snapshots along the reaction, including an unprecedented natural and competent Michaelis reaction complex for retaining enzymes. These structures strongly support the SNi-like reaction as the retaining mechanism for XXYLT1. Unexpectedly, the epidermal growth factor-like repeat acceptor substrate undergoes a large conformational change upon binding to the active site, providing a structural basis for substrate specificity. Our improved understanding of this retaining enzyme will accelerate the design of retaining GT inhibitors that can modulate Notch activity in pathological situations in which Notch dysregulation is known to cause cancer or developmental disorders. PubMed: 26414444DOI: 10.1038/nchembio.1927 PDB entries with the same primary citation |
Experimental method | X-RAY DIFFRACTION (3.03 Å) |
Structure validation
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