9X64
Crystal structure of DKK4 CRD1 domain
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SPRING-8 BEAMLINE BL32XU |
| Synchrotron site | SPring-8 |
| Beamline | BL32XU |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2025-01-31 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 1.0000 |
| Spacegroup name | P 1 21 1 |
| Unit cell lengths | 23.170, 67.550, 32.790 |
| Unit cell angles | 90.00, 91.65, 90.00 |
Refinement procedure
| Resolution | 33.770 - 1.830 |
| R-factor | 0.1911 |
| Rwork | 0.185 |
| R-free | 0.24570 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.773 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.21.2_5419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 33.780 | 1.940 |
| High resolution limit [Å] | 1.830 | 1.830 |
| Rmerge | 0.180 | 0.583 |
| Rmeas | 0.203 | 0.682 |
| Number of reflections | 8880 | 1421 |
| <I/σ(I)> | 5.77 | 1.57 |
| Completeness [%] | 99.1 | 98.6 |
| Redundancy | 4.6 | 3.59 |
| CC(1/2) | 0.981 | 0.682 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.5 | 277 | 0.2 M Ammonium nitrate and 20% (w/v) PEG 3350 |
