9W1D
Structure of nanobody sm8 against fenitrothion
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL10U2 |
| Synchrotron site | SSRF |
| Beamline | BL10U2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-06-10 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97918 |
| Spacegroup name | C 2 2 21 |
| Unit cell lengths | 46.070, 87.330, 62.020 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 43.665 - 1.730 |
| R-factor | 0.1913 |
| Rwork | 0.189 |
| R-free | 0.23100 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.006 |
| RMSD bond angle | 0.820 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | PHENIX |
| Refinement software | PHENIX ((1.16_3549: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 62.020 | 1.780 |
| High resolution limit [Å] | 1.730 | 1.730 |
| Rmerge | 0.037 | 0.165 |
| Rmeas | 0.184 | |
| Rpim | 0.011 | 0.077 |
| Number of reflections | 13343 | 911 |
| <I/σ(I)> | 34.3 | |
| Completeness [%] | 99.3 | |
| Redundancy | 10.5 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293.15 | 0.2M Ammonium acelate, 0.1M Bis-Tris pH 5.5, 45%(v/v) MPD |
