9VMQ
Crystal structure of Dot/Icm T4SS effector Ceg10(C159S)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL10U2 |
| Synchrotron site | SSRF |
| Beamline | BL10U2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-06-19 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97918 |
| Spacegroup name | P 1 |
| Unit cell lengths | 50.888, 54.596, 82.942 |
| Unit cell angles | 91.40, 91.11, 91.93 |
Refinement procedure
| Resolution | 20.000 - 1.790 |
| R-factor | 0.15612 |
| Rwork | 0.154 |
| R-free | 0.19890 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.307 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.8.0415) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 50.890 | 1.880 |
| High resolution limit [Å] | 1.790 | 1.790 |
| Number of reflections | 81024 | 11747 |
| <I/σ(I)> | 5.5 | |
| Completeness [%] | 95.9 | |
| Redundancy | 2.9 | |
| CC(1/2) | 0.995 | 0.923 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION | 289 | 0.1M sodium formate, 10% PEG3350, 15mM EDTA |






