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9RQZ

Galectin-3 with a bound inhibitor

This is a non-PDB format compatible entry.
Experimental procedure
Experimental methodSINGLE WAVELENGTH
Source typeSYNCHROTRON
Source detailsESRF BEAMLINE ID14-1
Synchrotron siteESRF
BeamlineID14-1
Temperature [K]100
Detector technologyPIXEL
Collection date2023-11-01
DetectorDECTRIS EIGER2 X CdTe 16M
Wavelength(s)0.886
Spacegroup nameP 21 21 21
Unit cell lengths34.644, 57.250, 61.053
Unit cell angles90.00, 90.00, 90.00
Refinement procedure
Resolution11.450 - 1.300
R-factor0.1614
Rwork0.160
R-free0.18210
Structure solution methodMOLECULAR REPLACEMENT
RMSD bond length0.012
RMSD bond angle1.210
Data reduction softwareautoPROC
Data scaling softwareAimless (0.7.15)
Phasing softwarePHASER
Refinement softwareBUSTER (2.11.8)
Data quality characteristics
 OverallInner shellOuter shell
Low resolution limit [Å]29.64029.6401.324
High resolution limit [Å]1.3003.6381.300
Rmerge0.1170.1080.272
Rmeas0.1280.1180.296
Rpim0.0500.0460.115
Total number of observations20145397039880
Number of reflections3053115271527
<I/σ(I)>10.7314.195.86
Completeness [%]99.899.797.1
Completeness (spherical) [%]99.899.797.1
Completeness (ellipsoidal) [%]99.899.797.1
Redundancy6.66.356.47
CC(1/2)0.9820.9690.953
Anomalous completeness (spherical)99.499.294.6
Anomalous completeness99.499.294.6
Anomalous redundancy3.53.73.4
CC(ano)-0.053-0.095-0.052
|DANO|/σ(DANO)0.70.70.7
Diffraction limitsPrincipal axes of ellipsoid fitted to diffraction cut-off surface
1.221 Å1.000, 1.000, 1.000
1.218 Å0.000, 0.000, 0.000
1.216 Å0.000, 0.000, 0.000
Criteria used in determination of diffraction limitslocal <I/sigmaI> ≥ 1.2
Crystallization Conditions
crystal IDmethodpHtemperaturedetails
1VAPOR DIFFUSION, SITTING DROP293Index A4: 0.1M BIS-TRIS pH 6.5, 2.0M Ammonium sulfate

257179

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