Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X10SA |
| Synchrotron site | SLS |
| Beamline | X10SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-02-20 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.9999988 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 40.398, 51.974, 89.650 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 24.020 - 1.312 |
| R-factor | 0.1976 |
| Rwork | 0.197 |
| R-free | 0.21870 |
| Structure solution method | MOLECULAR REPLACEMENT |
| Starting model (for MR) | 1LMNQ |
| RMSD bond length | 0.012 |
| RMSD bond angle | 1.190 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | PHASER |
| Refinement software | BUSTER (2.11.8) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 44.960 | 1.450 |
| High resolution limit [Å] | 1.310 | 1.310 |
| Rmerge | 0.076 | 1.204 |
| Number of reflections | 34228 | 1711 |
| <I/σ(I)> | 11.3 | 1.5 |
| Completeness [%] | 93.0 | 58.3 |
| Redundancy | 9.8 | 9 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 20 % PEG 4000, 0.2 M (NH4)2SO4 |
