9NOB
Crystal Structutre of unliganded Fab 224
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-2 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-07-29 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97931 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 56.857, 72.826, 127.951 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 26.480 - 1.690 |
| R-factor | 0.2 |
| Rwork | 0.199 |
| R-free | 0.23030 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.011 |
| RMSD bond angle | 1.111 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.21.2_5419: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 27.000 | 1.750 |
| High resolution limit [Å] | 1.690 | 1.690 |
| Rmerge | 0.147 | 0.879 |
| Rpim | 0.045 | 0.315 |
| Number of reflections | 60033 | 2821 |
| <I/σ(I)> | 25.2 | |
| Completeness [%] | 97.9 | |
| Redundancy | 10.9 | |
| CC(1/2) | 0.994 | 0.652 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293.15 | 0.17 M Ammonium Sulfate, 15% (v/v) Glycerol, 25.5 % (w/v) PEG4000 |






