Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | NSLS-II BEAMLINE 17-ID-2 |
| Synchrotron site | NSLS-II |
| Beamline | 17-ID-2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2025-02-14 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.97935 |
| Spacegroup name | I 2 3 |
| Unit cell lengths | 146.207, 146.207, 146.207 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 103.380 - 2.400 |
| R-factor | 0.2091 |
| Rwork | 0.208 |
| R-free | 0.23780 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.009 |
| RMSD bond angle | 1.105 |
| Data reduction software | XDS (BUILT 20241002) |
| Data scaling software | Aimless (0.7.9) |
| Phasing software | PHASER (2.8.3) |
| Refinement software | PHENIX (1.21_5207) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 103.384 | 103.384 | 2.441 |
| High resolution limit [Å] | 2.400 | 6.513 | 2.400 |
| Rmerge | 0.181 | 0.094 | 1.588 |
| Rmeas | 0.195 | 0.101 | |
| Rpim | 0.071 | 0.038 | 0.632 |
| Number of reflections | 20470 | 1082 | 1014 |
| <I/σ(I)> | 7.6 | 18.5 | 1.4 |
| Completeness [%] | 100.0 | ||
| Redundancy | 7.3 | ||
| CC(1/2) | 0.994 | 0.996 | 0.327 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 6.5 | 298 | 0.1 MES, 1.0 M sodium citrate, 0.5 mM TCEP |






