9JT3
Crystal structure of AbxF
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SSRF BEAMLINE BL10U2 |
| Synchrotron site | SSRF |
| Beamline | BL10U2 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-11-16 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.979183 |
| Spacegroup name | P 43 21 2 |
| Unit cell lengths | 75.883, 75.883, 166.115 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 56.020 - 2.000 |
| R-factor | 0.1961 |
| Rwork | 0.194 |
| R-free | 0.23180 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 0.866 |
| Data reduction software | xia2 |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | PHENIX ((1.20.1_4487: ???)) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 83.060 | 2.050 |
| High resolution limit [Å] | 2.000 | 2.000 |
| Rmerge | 0.085 | 0.433 |
| Rmeas | 0.087 | 0.447 |
| Rpim | 0.018 | 0.113 |
| Total number of observations | 723962 | 37600 |
| Number of reflections | 33722 | 2434 |
| <I/σ(I)> | 21 | 6.7 |
| Completeness [%] | 100.0 | |
| Redundancy | 21.5 | 15.4 |
| CC(1/2) | 0.998 | 0.965 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 291 | NaCl, Bistris, (NH4)2SO4 |






