9GZG
Crystal structure of CTPR4E4 mutant
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ALBA BEAMLINE XALOC |
| Synchrotron site | ALBA |
| Beamline | XALOC |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2024-05-10 |
| Detector | DECTRIS PILATUS3 6M |
| Wavelength(s) | 0.97926 |
| Spacegroup name | C 1 2 1 |
| Unit cell lengths | 105.915, 73.514, 40.778 |
| Unit cell angles | 90.00, 98.41, 90.00 |
Refinement procedure
| Resolution | 52.440 - 1.470 |
| R-factor | 0.19753 |
| Rwork | 0.196 |
| R-free | 0.23069 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.690 |
| Data reduction software | XDS |
| Data scaling software | autoPROC (1.0.5) |
| Phasing software | MOLREP (11.9.02) |
| Refinement software | REFMAC (5.8.0425) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 52.440 | 1.650 |
| High resolution limit [Å] | 1.470 | 1.470 |
| Rmerge | 0.098 | |
| Rmeas | 0.108 | |
| Rpim | 0.046 | |
| Number of reflections | 35904 | 1795 |
| <I/σ(I)> | 1.41 | |
| Completeness [%] | 86.9 | 37.3 |
| Redundancy | 4.7 | 4.2 |
| CC(1/2) | 0.988 | 0.418 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 4 | 291.15 | 8% v/v Tacsimate pH4, 20% w/v PEG 3350 |
