9GLQ
Crystal structure of p73 tetramerisation domain in complex with darpins 1800
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2019-02-01 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.99999 |
| Spacegroup name | I 2 2 2 |
| Unit cell lengths | 62.763, 94.816, 96.433 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 47.410 - 2.100 |
| R-factor | 0.2043 |
| Rwork | 0.202 |
| R-free | 0.24782 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.007 |
| RMSD bond angle | 1.189 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | REFMAC (5.8.0258) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 48.220 | 2.170 |
| High resolution limit [Å] | 2.100 | 2.100 |
| Rmerge | 0.053 | 0.913 |
| Rmeas | 0.060 | 1.056 |
| Rpim | 0.022 | 0.375 |
| Number of reflections | 17152 | 1653 |
| <I/σ(I)> | 15.1 | 2 |
| Completeness [%] | 99.9 | |
| Redundancy | 7.5 | 7.7 |
| CC(1/2) | 0.999 | 0.938 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293.15 | 30% PEG2000MME, 0.15M potassium bromide |






