9FX4
Crystal structure of Cryo2RT Thaumatin at 100K
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X10SA |
Synchrotron site | SLS |
Beamline | X10SA |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-09-13 |
Detector | DECTRIS EIGER2 X 16M |
Wavelength(s) | 1 |
Spacegroup name | P 41 21 2 |
Unit cell lengths | 57.864, 57.864, 149.900 |
Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
Resolution | 45.800 - 1.590 |
R-factor | 0.1916 |
Rwork | 0.191 |
R-free | 0.21030 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.010 |
RMSD bond angle | 1.050 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | PHASER |
Refinement software | BUSTER (2.10.4) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 45.800 | 1.690 |
High resolution limit [Å] | 1.590 | 1.590 |
Rmeas | 0.089 | 2.221 |
Number of reflections | 35191 | 5547 |
<I/σ(I)> | 23.32 | 1.31 |
Completeness [%] | 100.0 | 99.8 |
Redundancy | 25.7 | |
CC(1/2) | 1.000 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 293 | 1.6M Na. K. Tartrate |