9FSK
Crystal structure of the HECT domain of Smurf1
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SLS BEAMLINE X06DA |
Synchrotron site | SLS |
Beamline | X06DA |
Temperature [K] | 100 |
Detector technology | CCD |
Collection date | 2008-07-02 |
Detector | MARMOSAIC 225 mm CCD |
Wavelength(s) | 1.000 |
Spacegroup name | C 1 2 1 |
Unit cell lengths | 170.157, 74.318, 161.063 |
Unit cell angles | 90.00, 111.93, 90.00 |
Refinement procedure
Resolution | 78.920 - 2.750 |
R-factor | 0.2512 |
Rwork | 0.248 |
R-free | 0.30130 |
Structure solution method | MOLECULAR REPLACEMENT |
RMSD bond length | 0.008 |
RMSD bond angle | 0.950 |
Data reduction software | XDS |
Data scaling software | XSCALE |
Phasing software | MOLREP |
Refinement software | BUSTER (2.11.8) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 78.920 | 2.770 |
High resolution limit [Å] | 2.750 | 2.750 |
Rmerge | 0.092 | 0.600 |
Number of reflections | 48367 | 2419 |
<I/σ(I)> | 15.8 | |
Completeness [%] | 98.9 | |
Redundancy | 6.3 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, HANGING DROP | 293 | 25 % PEG 3350, 0.1 M Bis Tris pH 5.9, 0.2 M MgCl2, 0.02 M NH4OAc |