9FQP
EGFR Exon20 insertion mutant NPG bound with Compound 23
This is a non-PDB format compatible entry.
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | ESRF BEAMLINE MASSIF-1 |
| Synchrotron site | ESRF |
| Beamline | MASSIF-1 |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2021-04-29 |
| Detector | DECTRIS PILATUS 2M |
| Wavelength(s) | 0.965459 |
| Spacegroup name | C 2 2 21 |
| Unit cell lengths | 40.763, 107.213, 175.363 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 33.940 - 2.495 |
| R-factor | 0.2443 |
| Rwork | 0.243 |
| R-free | 0.27490 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.008 |
| RMSD bond angle | 0.880 |
| Data reduction software | XDS (Jan 10, 2022) |
| Data scaling software | Aimless (0.7.9) |
| Phasing software | PHASER (2.8.3) |
| Refinement software | BUSTER (2.11.8) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 33.937 | 33.937 | 2.606 |
| High resolution limit [Å] | 2.495 | 5.496 | 2.495 |
| Rmerge | 0.072 | 0.058 | 0.833 |
| Rmeas | 0.088 | 0.071 | 1.034 |
| Rpim | 0.049 | 0.040 | 0.600 |
| Total number of observations | 39852 | 3856 | 4262 |
| Number of reflections | 12861 | 1286 | 1286 |
| <I/σ(I)> | 8.47 | 15.47 | 1.49 |
| Completeness [%] | 92.9 | 92 | 77.4 |
| Completeness (spherical) [%] | 92.9 | 92.0 | 77.3 |
| Completeness (ellipsoidal) [%] | 92.9 | 92.0 | 77.4 |
| Redundancy | 3.1 | 3 | 3.31 |
| CC(1/2) | 0.979 | 0.967 | 0.568 |
| Anomalous completeness (spherical) | 84.7 | 89.0 | 73.8 |
| Anomalous completeness | 84.7 | 89.0 | 73.9 |
| Anomalous redundancy | 1.8 | 1.8 | 1.8 |
| CC(ano) | -0.266 | -0.309 | 0.087 |
| |DANO|/σ(DANO) | 0.7 | 0.7 | 0.6 |
| Diffraction limits | Principal axes of ellipsoid fitted to diffraction cut-off surface |
| 2.320 Å | 1.000, 1.000, 1.000 |
| 2.502 Å | 0.000, 0.000, 0.000 |
| 2.460 Å | 0.000, 0.000, 0.000 |
| Criteria used in determination of diffraction limits | local <I/sigmaI> ≥ 1.2 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 7.9 | 293 | 0.3 M Sodium Chloride, 50 mM TRIS-HCl pH 7.9, 9% v/v PEG 400 |






