9F24
DARPin eGFP complex DP4 (2G71)
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2023-09-06 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 1.0 |
| Spacegroup name | I 4 |
| Unit cell lengths | 136.026, 136.026, 75.206 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 43.020 - 2.060 |
| R-factor | 0.18414 |
| Rwork | 0.182 |
| R-free | 0.22156 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.010 |
| RMSD bond angle | 1.708 |
| Data reduction software | XDS |
| Data scaling software | XSCALE |
| Phasing software | MOLREP |
| Refinement software | REFMAC (5.8.0419) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 43.020 | 2.180 |
| High resolution limit [Å] | 2.057 | 2.057 |
| Rmerge | 0.074 | |
| Rmeas | 0.086 | |
| Number of reflections | 42465 | 6598 |
| <I/σ(I)> | 10.75 | |
| Completeness [%] | 98.8 | |
| Redundancy | 8.5 | |
| CC(1/2) | 0.998 | 0.421 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 277.15 | 0.1 M Tris, pH 8.5, 8% PEG 20000, 8% PEG 550 MME, 0.2 M KBr |
