9DTE
Crystal Structure of C2-02802
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | APS BEAMLINE 24-ID-C |
| Synchrotron site | APS |
| Beamline | 24-ID-C |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2021-11-29 |
| Detector | DECTRIS EIGER2 X 16M |
| Wavelength(s) | 0.97911 |
| Spacegroup name | H 3 |
| Unit cell lengths | 56.429, 56.429, 96.624 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 43.610 - 1.490 |
| R-factor | 0.1925 |
| Rwork | 0.192 |
| R-free | 0.21180 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.002 |
| RMSD bond angle | 0.368 |
| Data reduction software | XDS |
| Data scaling software | Aimless |
| Phasing software | PHASER |
| Refinement software | PHENIX (1.17.1_3660) |
Data quality characteristics
| Overall | Outer shell | |
| Low resolution limit [Å] | 43.610 | 1.510 |
| High resolution limit [Å] | 1.490 | 1.490 |
| Rmerge | 0.051 | 1.225 |
| Rpim | 0.029 | 0.688 |
| Number of reflections | 18820 | 874 |
| <I/σ(I)> | 11.6 | 0.7 |
| Completeness [%] | 99.6 | 94.9 |
| Redundancy | 5 | 4.6 |
| CC(1/2) | 0.997 | 0.430 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, SITTING DROP | 293 | 15% (w/v) PEG 1500 |






