8ZR0
Crystal structure of Skd3 in complex with AMPPNP
Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | PAL/PLS BEAMLINE 5C (4A) |
| Synchrotron site | PAL/PLS |
| Beamline | 5C (4A) |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2021-03-07 |
| Detector | DECTRIS EIGER X 9M |
| Wavelength(s) | 0.9794 |
| Spacegroup name | P 65 |
| Unit cell lengths | 119.699, 119.699, 89.980 |
| Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
| Resolution | 49.833 - 2.900 |
| R-factor | 0.2074 |
| Rwork | 0.205 |
| R-free | 0.25470 |
| Structure solution method | SAD |
| RMSD bond length | 0.008 |
| RMSD bond angle | 1.329 |
| Data reduction software | HKL-2000 |
| Data scaling software | HKL-2000 |
| Phasing software | PHENIX |
| Refinement software | PHENIX (1.9_1692) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 50.000 | 50.000 | 2.950 |
| High resolution limit [Å] | 2.900 | 7.860 | 2.900 |
| Rmerge | 0.053 | 0.034 | 0.298 |
| Rmeas | 0.056 | 0.035 | 0.330 |
| Rpim | 0.016 | 0.009 | 0.138 |
| Number of reflections | 16197 | 850 | 751 |
| <I/σ(I)> | 12.7 | ||
| Completeness [%] | 98.8 | 99.2 | 94.5 |
| Redundancy | 9.7 | 14.4 | 4.8 |
| CC(1/2) | 1.000 | 0.999 | 0.738 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 291 | 15% SOKALAN cp5, 100 mM Bis-Tris pH 6.0, 100 mM ammonium sulfate |






