8XPI
Structure of the C-terminal domain of nsp4 from PEDV
Experimental procedure
Experimental method | SINGLE WAVELENGTH |
Source type | SYNCHROTRON |
Source details | SSRF BEAMLINE BL02U1 |
Synchrotron site | SSRF |
Beamline | BL02U1 |
Temperature [K] | 100 |
Detector technology | PIXEL |
Collection date | 2023-12-14 |
Detector | DECTRIS EIGER2 S 9M |
Wavelength(s) | 0.97918 |
Spacegroup name | P 61 |
Unit cell lengths | 58.815, 58.815, 52.014 |
Unit cell angles | 90.00, 90.00, 120.00 |
Refinement procedure
Resolution | 29.410 - 1.840 |
R-factor | 0.2033 |
Rwork | 0.201 |
R-free | 0.24510 |
Structure solution method | SAD |
RMSD bond length | 0.010 |
RMSD bond angle | 1.341 |
Data reduction software | xia2 |
Data scaling software | Aimless |
Phasing software | PHASER |
Refinement software | PHENIX ((1.20.1_4487: ???)) |
Data quality characteristics
Overall | Outer shell | |
Low resolution limit [Å] | 50.940 | 1.940 |
High resolution limit [Å] | 1.840 | 1.840 |
Rmerge | 0.065 | 1.220 |
Number of reflections | 9006 | 1281 |
<I/σ(I)> | 21 | |
Completeness [%] | 99.9 | |
Redundancy | 17 |
Crystallization Conditions
crystal ID | method | pH | temperature | details |
1 | VAPOR DIFFUSION, SITTING DROP | 7 | 293 | 800 mM Succinic acid pH 7.0 |