Experimental procedure
| Experimental method | SINGLE WAVELENGTH |
| Source type | SYNCHROTRON |
| Source details | SLS BEAMLINE X06SA |
| Synchrotron site | SLS |
| Beamline | X06SA |
| Temperature [K] | 100 |
| Detector technology | PIXEL |
| Collection date | 2022-09-17 |
| Detector | DECTRIS EIGER X 16M |
| Wavelength(s) | 0.999870 |
| Spacegroup name | P 21 21 21 |
| Unit cell lengths | 31.181, 53.014, 59.114 |
| Unit cell angles | 90.00, 90.00, 90.00 |
Refinement procedure
| Resolution | 39.470 - 1.200 |
| Rwork | 0.131 |
| R-free | 0.15260 |
| Structure solution method | MOLECULAR REPLACEMENT |
| RMSD bond length | 0.013 |
| RMSD bond angle | 1.986 |
| Data reduction software | XDS |
| Data scaling software | XDS |
| Phasing software | MOLREP (11.9.02) |
| Refinement software | REFMAC (5.8.0419) |
Data quality characteristics
| Overall | Inner shell | Outer shell | |
| Low resolution limit [Å] | 39.470 | 39.470 | 1.220 |
| High resolution limit [Å] | 1.200 | 6.570 | 1.200 |
| Rmerge | 0.055 | 0.056 | 0.305 |
| Rmeas | 0.065 | 0.070 | 0.362 |
| Rpim | 0.035 | 0.041 | 0.192 |
| Number of reflections | 31352 | 236 | 1499 |
| <I/σ(I)> | 21.6 | 29.3 | 8.1 |
| Completeness [%] | 99.9 | 97.9 | |
| Redundancy | 6.3 | 4.2 | 6.3 |
| CC(1/2) | 0.996 | 0.983 | 0.959 |
Crystallization Conditions
| crystal ID | method | pH | temperature | details |
| 1 | VAPOR DIFFUSION, HANGING DROP | 7.5 | 298 | 0.1 M HEPES, 42 %(w/v) PEG200 |






